Romuald Conty
2d53208082
Fix unit tests
This commit bring tests to life!
New issue
Summary: test_dep_states test fails
When first device is idle, the second one states "RF Transmission Error" instead of simply not found any available device.
Full cutter log here:
debug libnfc.chip.pn53x InJumpForDEP
debug libnfc.chip.pn53x Timeout values: 300
debug libnfc.bus.uart TX: 00 00 ff 05 fb d4 56 00 00 00 d6 00
debug libnfc.bus.uart RX: 00 00 ff 00 ff 00
debug libnfc.chip.pn53x PN53x ACKed
debug libnfc.bus.uart Timeout!
debug libnfc.chip.pn53x InJumpForDEP
debug libnfc.chip.pn53x Timeout values: 300
debug libnfc.bus.uart TX: 00 00 ff 05 fb d4 56 00 00 00 d6 00
debug libnfc.bus.uart RX: 00 00 ff 00 ff 00
debug libnfc.chip.pn53x PN53x ACKed
debug libnfc.bus.uart RX: 00 00 ff 03 fd
debug libnfc.bus.uart RX: d5 57
debug libnfc.bus.uart RX: 01
debug libnfc.bus.uart RX: d3 00
debug libnfc.chip.pn53x Chip error: "Timeout" (01), returned error: "RF Transmission Error" (-20))
F
===============================================================================
Failure: test_dep_states
Problem with nfc_idle
<0 == res>
expected: <0>
actual: <-20>
diff:
? -20
./test_device_modes_as_dep.c:171: initiator_thread(): cut_assert_equal_int(0, res, cut_test_context_set_current_result_user_message( cut_test_context_current_peek(), cut_test_context_take_printf(cut_test_context_current_peek(), "Problem with nfc_idle")))
===============================================================================
2013-01-18 18:28:45 +01:00
..
2012-05-18 07:38:42 +00:00
2010-08-11 16:36:35 +00:00
2013-01-18 18:28:45 +01:00
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2013-01-18 18:28:45 +01:00